X-Ray Fluorescence (XRF) X-MET

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Brand : OXFORD,THERMO SCIENTIFIC,HITACHI,OLYMPUS,BRUKER

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X-Ray Fluorescence (XRF) X-MET

X-MET 5000 Series

X-MET® for soil analysis

X-MET enables GPS integration for real-time correlation of measurement data and location coordinates.

  • Accurate and reliable identification of heavy element pollutants
  • Define the extremities of ‘hotspots’ in seconds
  • Easy data transfer to PC assures maximum efficiency and minimum errors when working on-site
  • Pre-sort contaminated soil to minimize remediation costs
  • Soil remediation decisions made instantly
  • Fast and reliable Go/No-Go decisions,
  • and fully configurable Pass/Fail alarms

Rugged and reliable tool for fast analysis

  • Withstands all weather conditions and rough treatment
  • IP54 (NEMA 3) approved. Superior dust and moisture protection
  • High-strength environmentally sealed housing
  • Long battery operating time, charge indicator on battery and user interface

High performance

  • Fast, single-shot heavy element analysis: Pb, As, Cr, Cu, Zn, Ni, Cd, Co, Se, Mo, Hg,Sb, Ag, Ba etc.
  • Al, Si, P, S analysis of prepared samples.
  • Fast measurement time: 30 – 120 seconds

(X-MET5000) or 5 – 30 seconds

(X-MET5100), depending on the elements of interest and required precision

  • Low detection limits, X-MET5000 can typically detect 5 – 30 ppm concentration with a 120s measurement time. X-MET5100 detection limits are even lower and ppm level analysis can be achieved in just 10 – 30 seconds
  • Measures all 26 elements defined in EPA6200
  • High speed automatic averaging: Calculates averages of 2 – 50 measurements and saves individual results and averaged results

X-Ray Fluorescence (XRF) X-MET

X-MET® for mining

Fast, on-site ore analysis

At the pull of a trigger, Oxford Instruments’ hand-held X-MET5000 and X-MET5100 X-ray fluorescence (XRF) analyzers deliver fast, highly accurate on-site sample screening and analysis.

Minimal need for expensive and time consuming laboratory analysis

  • Highly accurate ore analysis from Al to U
  • Reliable Al, Si, P, S analysis without vacuum or helium attachments
  • Measure directly on drill core sample
  • Certified IP54 NEMA 3 splash and dust proof
  • Results obtained in seconds
  • Optional easy-to-use software for unbeatable accuracy
  • Universal Fundamental Parameter analysis mode for measurement of ores without known standards
  • Go/No-Go user configurable result format
  • User interface in >10 languages
  • Rapid data transfer to PC

High performance

  • Single-shot analysis of all important elements in ore exploration: Fe, Cu, Cr, Zn, Pb, Mn, Ni, Co, Mo, Ta, W etc.
  • Al, Si, P, S analysis of prepared samples.
  • Advanced automatic matrix correction
  • Rapid analysis with typical measurement times of 10 – 30 seconds (X-MET5000) or 2 – 5 seconds (X-MET5100) depending on the elements of interest and required precision
  • Low detection limits, X-MET5000 can typically detect 5 – 30 ppm concentration with 120s measuring time. X-MET5100 detection limits are even lower and ppm level analysis can be done in just 10 – 30 seconds
  • High speed automatic averaging – calculate averages of 2 – 50 measurements and save both individual results and average results in a log file

Silicon Drift Detector technology improves productivity:

Top of the range X-MET5100 combines Oxford Instruments groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and significant accuracy improvement over conventional systems.

Specifications :

X-MET5100

Analyzer :

  • Hand-held EDXRF Analyzer
  • Oxford Instruments Silicon Drift (SDD) high resolution detector
  • 45 kV Rh target X-ray tube (max 50uA)
  • Automatic 5-position filter changer
  • Measurement spot size 9 mm
  • Operating temperature: -10????C to +50????C

Computer :

  • HP PDA with Windows Mobile 5.0 OS
  • 128 MB Internal memory
  • Min. 1 GB Removable memory
  • Capable of holding > 100,000 results and spectra
  • Data transfer via supplied USB cable; IR; WiFi, Bluetooth
  • Touch-screen controlled graphical user interface (12 languages)

Analytical range :

From Mg to U, up to 35 elements depending on calibration.

Batteries :

  • Rechargeable, removable inside handle
  • Li-Ion batteries (Quantity 2)
  • Typical duty cycle: 6 hours of operation each. Continuous (tube on)
  • measurement: 3-4h.
  • 110/230V 50/60 Hz battery charger, including AC adaptor.

Radiation Safety :

  • Password protection
  • IR proximity sensor
  • Three failsafe warning lights

Dimensions : 9 cm(W) x 30 cm(L) x 27 cm(H)

Weight : 1.7 kg with battery and PDA installed

Carrying and Transportation : Waterproof field carrying case, Wrist strap.

Standard Accessories :

  • Protective PDA rain cover
  • Check samples (depending on calibrations)
  • Standardization sample
  • Memory card reader
  • User Manual (English)
  • Quick Start Guide (12 languages)
  • PDA cradle and AC adapter

X-MET® Accessories :

  1. Pistol Holder
  2. Bench-Top Stand
  3. Barcode Scanner
  4. Portable Bluetooth® Printer
  5. Light Instrument Stand and Safety Shield for Small Samples
  6. Sample bag adaptor
  7. Flat surface adaptor
  8. Bluetooth®GPS receiver
  9. Background Plate
  10. Tools for Sample Preparation
  11. Weld Beam Collimator

Untuk mengetahui lebih detail model/type dan spesifikasi dari XRF X-MET silahkan click link/tautan yang ada di bawah ini :

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X-MET 7000 Series

X-MET7000 : Cost effective tool for routine, simple applications, when light elements determination is not needed.

X-MET7000 eXpress : When extra speed, improved precision and lower limits of detection are required, without the need for the light elements analysis.

X-MET7500 : Highest performance for the widest variety of materials For maximum flexibility Light elements analysis, without the need for Helium purge or vacuum

NEW X-MET7500 Mining Analyser : Designed for mining and soil applications.

With NEW large area SDD for ultra low detection limits. New software to report, compounds and pseudo elements.

X-MET7000 Series accessories

To boost productivity even further

The X-MET7000 Series accessories include :

  • Benchtop stand: turn the X-MET into a laboratory benchtop analyser in seconds. Ideal for measuring jewellery items, sample cups,fasteners, small objects etc.
  • Light stand and radiation shield: to safely and easily measure small items in the field, or when long measurements times are required.
  • Holster with belt: for hands-free on-site transportation and easy access to the analyser.
  • Portable Bluetooth® printer: perfect solution when instant prints or handouts are required in the field.

X-MET7000 Series specifications :

X-MET7000 X-MET7000
eXpress		 X-MET7500 NEW X-MET7500
Mining Analyser
Weight < 1.8kg
Dimensions 9 cm (W) x 28 cm (L) x 27 cm (H)
X-ray tube 40 kV Rh target 40 kV Rh target 45 kV Rh target 45 kV Rh target
Detector type Si-PIN diode Silicon-drift detector (SDD) Silicon-drift detector (SDD) Large area SDD
Elemental range K - U K - U K - U K - U
Calibrations Combination of semi-quantitative methods (FP) and quantitative,traceable empirical calibrations
Sample temperature Up to 400°C Up to 400°C Up to 120°C Up to 120°C

Untuk mengetahui lebih detail model/type dan spesifikasi dari XRF X-MET silahkan click link/tautan yang ada di bawah ini :

Untuk informasi,pertanyaan dan pemesanan silahkan hubungi kami di :

X-Ray Fluorescence (XRF) X-MET

  • PT. Mora Anugerah Berkat (M.A.B)
  • Alamat : Jl.Taman Asri Blok M No.36 Kel.Cipadu Kec.Larangan, Kota Tangerang - Provinsi Banten
  • Phone : 021 7345.7064 / 7366.0160
  • Mobile : 0812.8140.0749 / 0812.8770.5470
  • Chat : Whats App,Line,WeChat,Telegram
  • Website : www.moraanugerah.id - www.moraanugerah.com/
  • Email: info@moraanugerah.com - info@moraanugerah.id - marketing_div@moraanugerah.com

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